Faculty of Electrical Engineering and Information Technology
Department/Institute: Institute of Nuclear and Physical Engineering
Contact person: Ing. Milan Pavúk, Ph.D.
Contact: +421 2 6029 1832
The Atomic Force Microscopy (AFM) is a method which allows scientists to examine the surface properties of samples with high spatial resolution. This method is based on the measurement of force interaction acting between the probe and surface of the sample. The probe is a sharp tip located at the free end of a flexible cantilever. It is subsequently brought into tight vicinity of the sample surface. Mechanical changes of the cantilever induced by acting of atomic forces are detected by optical system.
The Magnetic Force Microscopy (MFM) is an operational mode of Atomic Force Microscope which enables to measure the magnetic field gradients over the surface of the sample.
Miglierini, Marcel - Pavúk, Milan: Mössbauer and MFM investigations of surface magnetism in NANOPERM nanocrystalline alloys, Acta Physica Polonica A (in press)
Pavúk, Milan - Miglierini, Marcel - Sitek, Jozef: Magnetic Structure at the Surface of a FeZrB Alloy. In: APCOM 2013. Applied Physics of Condensed Matter : Proceedings of the 19th International Conference. Štrbské Pleso, Slovak Republic, June 19-21, 2013. - Bratislava, 2013. - ISBN 978-80-227-3956-6. - pp. 103-106
Pavúk, Milan - Ballo, Peter - Brunner, Boris - Weis, Martin: MFM Study of Core/Cover Interface in a MgB2/Fe Superconducting Wire. In: APCOM 2012. Applied Physics of Condensed Matter : Proceedings of the 18th International Conference. Štrbské Pleso, Slovak Republic, June 20-22, 2012. - Bratislava, 2012. - ISBN 978-80-227-3720-3. - pp. 361-364
Fig. 1: The Atomic Force Microscope and its components.
From the left: control unit, computer, and microscope.
Fig. 2: The microscope placed on the pneumatic anti-vibration table under isolating cover.
Fig. 3: The Dimension Edge™ AFM from the Veeco Co.