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Prof. Ondrej Křivánek  - spoluzakladateľ a prezident firmy NION, Kirkland WA a profesor na Ústave fyziky na Arizonskej štátnej univerzite, Tempe AZ, USA prednášal v pondelok 13. marca 2017 na pôde STU.

Na prednáške “Electron-optical methods for molecular and atomic-level characterization” sa zúčastnilo 25 poslucháčov z STU, SAV, UK.

Firma NION patrí medzi 3 svetové firmy (NION, JEOL a FEI), ktoré vyrábajú špičkové TEM mikroskopy s vysokým subatomárnym rozlíšením.

Prof. Ondrej Křiváneksa môže pochváliť vyše 7 000 citáciami na svoje vedecké články, prispieva pravidelne do takých prestížnych časopisov akými sú Nature a Science


Ondřej Křivánek, FRS is the President of Nion Co. and Adjunct Professor at Arizona State University.

Ondřej is well known for pioneering new techniques of structure research and for designing new instruments, including simple-to-operate serial and parallel detection electron energy-loss spectrometers (EELS), post column-imaging filters, electron microscopy software (Gatan DigitalMicrograph), the first working aberration corrector for a scanning transmission electron microscope (STEM) and an advanced aberration-corrected electron microscope (the Nion UltraSTEM).

In 1997 Ondřej and Niklas Dellby founded Nion Company, which introduced instruments that have established many important benchmarks, from producing the first-ever sub-Å electron probe to sub-10 meV energy resolution EELS, which now allows vibrational spectroscopy to be carried out in the electron microscope. Monochromated, aberration-corrected scanning transmission electron microscopes (MAC-STEMs) are able to form intense electron probes as small as 0.5-1 Å in diameter, to analyze single atoms spectroscopically (by electron energy loss spectroscopy (EELS) or energy-dispersive X-ray spectroscopy (EDXS)), and to probe the chemical composition of organic materials while avoiding radiation damage.

Krivanek´s papers and book chapters have been cited over 7000 times, and he is a Fellow of American Physical Society, the British Institute of Physics, the Microscopy Society of America, the Royal Microscopical Society, and the British Royal Society.

Prednáška O. Křiváneka v Centre pre  nanodiagnostiku STU:

prednáška O. Křiváneka v Centre pre nanodiagnostiku

O. Křivánek a tím Centra pre nanodiagnostiku STU:

O. Křivánek a tím Centra pre nanodiagnostiku STU